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Minzhang Hu, Hui Li, Chongyang Shen, Lelin Xing, Hongtao Hao. 2016: Three-dimensional admittance analysis of lithospheric elastic thickness over the Louisville Ridge. Earthquake Science, 29(2): 117-125. DOI: 10.1007/s11589-016-0147-2
Citation: Minzhang Hu, Hui Li, Chongyang Shen, Lelin Xing, Hongtao Hao. 2016: Three-dimensional admittance analysis of lithospheric elastic thickness over the Louisville Ridge. Earthquake Science, 29(2): 117-125. DOI: 10.1007/s11589-016-0147-2

Three-dimensional admittance analysis of lithospheric elastic thickness over the Louisville Ridge

  • Using bathymetry and altimetric gravity anomalies, a 1° × 1° lithospheric effective elastic thickness (Te) model over the Louisville Ridge and its adjacent regions is calculated using the moving window admittance technique. For comparison, three bathymetry models are used: general bathymetric charts of the oceans, SIO V15.1, and BAT_VGG. The results show that BAT_VGG is more suitable for calculating Te than the other two models. Te along the Louisville Ridge was re-evaluated. The southeast of the ridge has a medium Te of 10–20 km, while Te increases dramatically seaward of the Tonga-Kermadec trench as a result of the collision of the Pacific and Indo-Australian plates.
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